Piet Engelke, Ilia Polian, Michel Renovell, Sandip Kundu, Bharath Seshadri, Bernd Becker. On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. IEEE Trans. on CAD of Integrated Circuits and Systems, 27(2):327-338, 2008. [doi]
Abstract is missing.