The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults - researchr publication authors

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Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker. The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 171-178, IEEE Computer Society, 2004. [doi]

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