Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker. The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 171-178, IEEE Computer Society, 2004. [doi]
@inproceedings{EngelkePRSB04,
title = {The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults},
author = {Piet Engelke and Ilia Polian and Michel Renovell and Bharath Seshadri and Bernd Becker},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/vts/2004/2134/00/21340171abs.htm},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/EngelkePRSB04},
cites = {0},
citedby = {0},
pages = {171-178},
booktitle = {22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2134-7},
}