Dominik Erb, Michael A. Kochte, Sven Reimer, Matthias Sauer, Hans-Joachim Wunderlich, Bernd Becker. Accurate QBF-Based Test Pattern Generation in Presence of Unknown Values. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(12):2025-2038, 2015. [doi]
Abstract is missing.