Dominik Erb, Karsten Scheibler, Matthias Sauer, Sudhakar M. Reddy, Bernd Becker. Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 131-136, IEEE Computer Society, 2014. [doi]
Abstract is missing.