Prediction of LIN communication robustness against EFT events using dedicated failure models - researchr publication authors

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Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectronics Reliability, 76:685-691, 2017. [doi]

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