Prediction of LIN communication robustness against EFT events using dedicated failure models

Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Prediction of LIN communication robustness against EFT events using dedicated failure models. Microelectronics Reliability, 76:685-691, 2017. [doi]

Abstract

Abstract is missing.