Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen. Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-7, IEEE, 2017. [doi]
@inproceedings{EsenCXDVG17-0,
title = {Non-intrusive detection of defects in mixed-signal integrated circuits using light activation},
author = {Baris Esen and Anthony Coyette and Nektar Xama and Wim Dobbelaere and Ronny Vanhooren and Georges G. E. Gielen},
year = {2017},
doi = {10.1109/TEST.2017.8242056},
url = {https://doi.org/10.1109/TEST.2017.8242056},
researchr = {https://researchr.org/publication/EsenCXDVG17-0},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3413-4},
}