Back-gate bias effect on UTBB-FDSOI non-linearity performance

B. Kazemi Esfeh, Valeria Kilchytska, B. Parvais, Nicolas Planes, M. Haond, Denis Flandre, Jean-Pierre Raskin. Back-gate bias effect on UTBB-FDSOI non-linearity performance. In 47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017. pages 148-151, IEEE, 2017. [doi]

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