B. Kazemi Esfeh, Valeria Kilchytska, B. Parvais, Nicolas Planes, M. Haond, Denis Flandre, Jean-Pierre Raskin. Back-gate bias effect on UTBB-FDSOI non-linearity performance. In 47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017. pages 148-151, IEEE, 2017. [doi]
@inproceedings{EsfehKPPHFR17,
title = {Back-gate bias effect on UTBB-FDSOI non-linearity performance},
author = {B. Kazemi Esfeh and Valeria Kilchytska and B. Parvais and Nicolas Planes and M. Haond and Denis Flandre and Jean-Pierre Raskin},
year = {2017},
doi = {10.1109/ESSDERC.2017.8066613},
url = {https://doi.org/10.1109/ESSDERC.2017.8066613},
researchr = {https://researchr.org/publication/EsfehKPPHFR17},
cites = {0},
citedby = {0},
pages = {148-151},
booktitle = {47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5978-2},
}