Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits

Michael Ogbonna Esonu, Dhamin Al-Khalili, Come Rozon. Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. In ISCAS. pages 1714-1717, 1993.

Abstract

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