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Concentration of Measure Phenomenon and its Implications for Sample-based Planning Algorithms in Very-High Dimensional Configuration Spaces

Joel M. Esposito. Concentration of Measure Phenomenon and its Implications for Sample-based Planning Algorithms in Very-High Dimensional Configuration Spaces. In IEEE International Conference on Robotics and Automation, ICRA 2023, London, UK, May 29 - June 2, 2023. pages 7865-7871, IEEE, 2023. [doi]

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