Fault-Model-Based Test Generation for Embedded Software

Michael Esser, Peter Struss. Fault-Model-Based Test Generation for Embedded Software. In Manuela M. Veloso, editor, IJCAI 2007, Proceedings of the 20th International Joint Conference on Artificial Intelligence, Hyderabad, India, January 6-12, 2007. pages 342-347, 2007. [doi]

Authors

Michael Esser

This author has not been identified. Look up 'Michael Esser' in Google

Peter Struss

This author has not been identified. Look up 'Peter Struss' in Google