Michael Esser, Peter Struss. Fault-Model-Based Test Generation for Embedded Software. In Manuela M. Veloso, editor, IJCAI 2007, Proceedings of the 20th International Joint Conference on Artificial Intelligence, Hyderabad, India, January 6-12, 2007. pages 342-347, 2007. [doi]
@inproceedings{EsserS07:0,
title = {Fault-Model-Based Test Generation for Embedded Software},
author = {Michael Esser and Peter Struss},
year = {2007},
url = {http://dli.iiit.ac.in/ijcai/IJCAI-2007/PDF/IJCAI07-053.pdf},
tags = {rule-based, embedded software, testing},
researchr = {https://researchr.org/publication/EsserS07%3A0},
cites = {0},
citedby = {0},
pages = {342-347},
booktitle = {IJCAI 2007, Proceedings of the 20th International Joint Conference on Artificial Intelligence, Hyderabad, India, January 6-12, 2007},
editor = {Manuela M. Veloso},
}