Study of CDM specific effects for a smart power input protection structure

M. Etherton, N. Qu, J. Willemen, Wolfgang Wilkening, S. Mettler, M. Dissegna, R. Stella, L. Zullino, A. Andreini, Horst A. Gieser. Study of CDM specific effects for a smart power input protection structure. Microelectronics Reliability, 46(5-6):666-676, 2006. [doi]

Abstract

Abstract is missing.