Adrian Evans, Dan Alexandrescu, Veronique Ferlet-Cavrois, Kay-Obbe Voss. Techniques for heavy ion microbeam analysis of FPGA SER sensitivty. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 6, IEEE, 2015. [doi]
@inproceedings{EvansAFV15,
title = {Techniques for heavy ion microbeam analysis of FPGA SER sensitivty},
author = {Adrian Evans and Dan Alexandrescu and Veronique Ferlet-Cavrois and Kay-Obbe Voss},
year = {2015},
doi = {10.1109/IRPS.2015.7112826},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112826},
researchr = {https://researchr.org/publication/EvansAFV15},
cites = {0},
citedby = {0},
pages = {6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}