M. A. Exarchos, G. J. Papaioannou, Jalal Jomaah, Francis Balestra. Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs. Microelectronics Reliability, 49(9-11):1018-1023, 2009. [doi]
@article{ExarchosPJB09,
title = {Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs},
author = {M. A. Exarchos and G. J. Papaioannou and Jalal Jomaah and Francis Balestra},
year = {2009},
doi = {10.1016/j.microrel.2009.07.024},
url = {http://dx.doi.org/10.1016/j.microrel.2009.07.024},
researchr = {https://researchr.org/publication/ExarchosPJB09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1018-1023},
}