Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix - researchr publication authors

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Hicham Ezzat, Lirida A. B. Naviner. Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 524-527, IEEE, 2010. [doi]

This author has not been identified. Look up 'Hicham Ezzat' in GoogleThis author has not been identified. Look up 'Lirida A. B. Naviner' in Google

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