Hicham Ezzat, Lirida A. B. Naviner. Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 524-527, IEEE, 2010. [doi]
@inproceedings{EzzatN10,
title = {Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix},
author = {Hicham Ezzat and Lirida A. B. Naviner},
year = {2010},
doi = {10.1109/ISQED.2010.5450527},
url = {http://dx.doi.org/10.1109/ISQED.2010.5450527},
tags = {analysis, reliability},
researchr = {https://researchr.org/publication/EzzatN10},
cites = {0},
citedby = {0},
pages = {524-527},
booktitle = {11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA},
publisher = {IEEE},
isbn = {978-1-4244-6455-5},
}