Hicham Ezzat, Lirida A. B. Naviner. Level matrix propagation for reliability analysis of nano-scale circuits based on probabilistic transfer matrix. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 524-527, IEEE, 2010. [doi]
Abstract is missing.