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Vouw: Geometric Pattern Mining Using the MDL Principle

Micky Faas, Matthijs van Leeuwen. Vouw: Geometric Pattern Mining Using the MDL Principle. In Michael R. Berthold, Ad Feelders, Georg Krempl, editors, Advances in Intelligent Data Analysis XVIII - 18th International Symposium on Intelligent Data Analysis, IDA 2020, Konstanz, Germany, April 27-29, 2020, Proceedings. Volume 12080 of Lecture Notes in Computer Science, pages 158-170, Springer, 2020. [doi]

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Micky Faas

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Matthijs van Leeuwen

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