Micky Faas, Matthijs van Leeuwen. Vouw: Geometric Pattern Mining Using the MDL Principle. In Michael R. Berthold, Ad Feelders, Georg Krempl, editors, Advances in Intelligent Data Analysis XVIII - 18th International Symposium on Intelligent Data Analysis, IDA 2020, Konstanz, Germany, April 27-29, 2020, Proceedings. Volume 12080 of Lecture Notes in Computer Science, pages 158-170, Springer, 2020. [doi]
@inproceedings{FaasL20,
title = {Vouw: Geometric Pattern Mining Using the MDL Principle},
author = {Micky Faas and Matthijs van Leeuwen},
year = {2020},
doi = {10.1007/978-3-030-44584-3_13},
url = {https://doi.org/10.1007/978-3-030-44584-3_13},
researchr = {https://researchr.org/publication/FaasL20},
cites = {0},
citedby = {0},
pages = {158-170},
booktitle = {Advances in Intelligent Data Analysis XVIII - 18th International Symposium on Intelligent Data Analysis, IDA 2020, Konstanz, Germany, April 27-29, 2020, Proceedings},
editor = {Michael R. Berthold and Ad Feelders and Georg Krempl},
volume = {12080},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-44584-3},
}