Mohammed Fakhruddin, Kuok-Khian Lo, James Karp, Michael J. Hart, Min-Hsing P. Chen. Verification methodology to guarantee low routing resistance to well taps. In 19th International Symposium on Quality Electronic Design, ISQED 2018, Santa Clara, CA, USA, March 13-14, 2018. pages 257-261, IEEE, 2018. [doi]
@inproceedings{FakhruddinLKHC18,
title = {Verification methodology to guarantee low routing resistance to well taps},
author = {Mohammed Fakhruddin and Kuok-Khian Lo and James Karp and Michael J. Hart and Min-Hsing P. Chen},
year = {2018},
doi = {10.1109/ISQED.2018.8357297},
url = {https://doi.org/10.1109/ISQED.2018.8357297},
researchr = {https://researchr.org/publication/FakhruddinLKHC18},
cites = {0},
citedby = {0},
pages = {257-261},
booktitle = {19th International Symposium on Quality Electronic Design, ISQED 2018, Santa Clara, CA, USA, March 13-14, 2018},
publisher = {IEEE},
isbn = {978-1-5386-1214-9},
}