Mohammed Fakhruddin, Kuok-Khian Lo, James Karp, Michael J. Hart, Min-Hsing P. Chen. Verification methodology to guarantee low routing resistance to well taps. In 19th International Symposium on Quality Electronic Design, ISQED 2018, Santa Clara, CA, USA, March 13-14, 2018. pages 257-261, IEEE, 2018. [doi]
Abstract is missing.