Xiaoxin Fan, Sudhakar M. Reddy, Irith Pomeranz. Max-Fill: A method to generate high quality delay tests. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 375-380, IEEE, 2011. [doi]
Abstract is missing.