Xiaoxin Fan, Manish Sharma, Wu-Tung Cheng, Sudhakar M. Reddy. Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 7-12, IEEE Computer Society, 2012. [doi]
Abstract is missing.