Y. Fan, A. Verma, D. S. Trager, R. K. Poorfard, J. Janney, S. Kumar. Accelerating capture of infrequent errors on ATE for silicon TV tuners. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.