Liquan Fang, Guido Gronthoud, Hans G. Kerkhoff. Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design. In 6th European Test Workshop, ETW 2001, Stockholm, Sweden, May 29 - June 1, 2001. pages 61-67, IEEE Computer Society, 2001. [doi]
Abstract is missing.