Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Jianxin Fang, Sachin S. Sapatnekar. Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 689-694, IEEE, 2011. [doi]

This author has not been identified. Look up 'Jianxin Fang' in GoogleThis author has not been identified. Look up 'Sachin S. Sapatnekar' in Google

runs on WebDSL