Jianxin Fang, Sachin S. Sapatnekar. Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 689-694, IEEE, 2011. [doi]
Abstract is missing.