Jianxin Fang, Sachin S. Sapatnekar. Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 689-694, IEEE, 2011. [doi]
@inproceedings{FangS11, title = {Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability}, author = {Jianxin Fang and Sachin S. Sapatnekar}, year = {2011}, doi = {10.1109/ASPDAC.2011.5722275}, url = {http://dx.doi.org/10.1109/ASPDAC.2011.5722275}, tags = {reliability}, researchr = {https://researchr.org/publication/FangS11}, cites = {0}, citedby = {0}, pages = {689-694}, booktitle = {Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011}, publisher = {IEEE}, isbn = {978-1-4244-7516-2}, }