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Reliability-aware cross-layer custom instruction screening

Bahareh J. Farahani, Ali Azarpeyvand, Saeed Safari, Seid Mehdi Fakhraie. Reliability-aware cross-layer custom instruction screening. In Lukás Sekanina, Görschwin Fey, Jaan Raik, Snorre Aunet, Richard Ruzicka, editors, 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013. pages 258-262, IEEE Computer Society, 2013. [doi]

Authors

Bahareh J. Farahani

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Ali Azarpeyvand

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Saeed Safari

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Seid Mehdi Fakhraie

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