Farimah Farahmandi, Ronny Morad, Avi Ziv, Ziv Nevo, Prabhat Mishra. Cost-effective analysis of post-silicon functional coverage events. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 392-397, IEEE, 2017. [doi]
@inproceedings{FarahmandiMZNM17,
title = {Cost-effective analysis of post-silicon functional coverage events},
author = {Farimah Farahmandi and Ronny Morad and Avi Ziv and Ziv Nevo and Prabhat Mishra},
year = {2017},
doi = {10.23919/DATE.2017.7927022},
url = {https://doi.org/10.23919/DATE.2017.7927022},
researchr = {https://researchr.org/publication/FarahmandiMZNM17},
cites = {0},
citedby = {0},
pages = {392-397},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017},
editor = {David Atienza and Giorgio Di Natale},
publisher = {IEEE},
isbn = {978-3-9815370-8-6},
}