Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen. The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
@inproceedings{FarayolaBCSRC22,
title = {The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing},
author = {Praise O. Farayola and Isaac Bruce and Shravan K. Chaganti and Abalhassan Sheikh and Srivaths Ravi 0001 and Degang Chen},
year = {2022},
doi = {10.1109/VTS52500.2021.9794216},
url = {https://doi.org/10.1109/VTS52500.2021.9794216},
researchr = {https://researchr.org/publication/FarayolaBCSRC22},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1060-1},
}