Praise O. Farayola, Ekaniyere Oko-Odion, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi 0001, Degang Chen 0001. Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction. IEEE Design & Test of Computers, 40(5):52-61, October 2023. [doi]
@article{FarayolaOCSRC23,
title = {Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction},
author = {Praise O. Farayola and Ekaniyere Oko-Odion and Shravan K. Chaganti and Abalhassan Sheikh and Srivaths Ravi 0001 and Degang Chen 0001},
year = {2023},
month = {October},
doi = {10.1109/MDAT.2023.3261799},
url = {https://doi.org/10.1109/MDAT.2023.3261799},
researchr = {https://researchr.org/publication/FarayolaOCSRC23},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {40},
number = {5},
pages = {52-61},
}