Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
H. A. Farhat, H. Saidian. Testability profile estimation of VLSI circuits from fault coverage. In First Great Lakes Symposium on VLSI, 1991, Kalamazoo, MI, USA, March 1-2, 1991. pages 238-242, IEEE, 1991. [doi]
Abstract is missing.