J. Farmer, W. Whitehead, A. Hall, Dmitry Veksler, Gennadi Bersuker, David Z. Gao, Al-Moatasem El-Sayed, T. Durrant, Alexander L. Shluger, Thomas Rueckes, Lee Cleveland, Harry Luan, R. Sen. Mitigating switching variability in carbon nanotube memristors. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.