Markov source based test length optimized SCAN-BIST architecture - researchr publication authors

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Aftab Farooqi, Richard O. Gale, Sudhakar M. Reddy, Brian Nutter, Chris Monico. Markov source based test length optimized SCAN-BIST architecture. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 708-713, IEEE, 2009. [doi]

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