Aftab Farooqi, Richard O. Gale, Sudhakar M. Reddy, Brian Nutter, Chris Monico. Markov source based test length optimized SCAN-BIST architecture. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 708-713, IEEE, 2009. [doi]
@inproceedings{FarooqiGRNM09,
title = {Markov source based test length optimized SCAN-BIST architecture},
author = {Aftab Farooqi and Richard O. Gale and Sudhakar M. Reddy and Brian Nutter and Chris Monico},
year = {2009},
doi = {10.1109/ISQED.2009.4810380},
url = {http://dx.doi.org/10.1109/ISQED.2009.4810380},
tags = {optimization, rule-based, architecture, testing, source-to-source, Markov, open-source},
researchr = {https://researchr.org/publication/FarooqiGRNM09},
cites = {0},
citedby = {0},
pages = {708-713},
booktitle = {10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA},
publisher = {IEEE},
}