A Correlated Double Sampling Technique for Charge-Sensitive Amplifiers based on TFTs

Marco Fattori, Enrico Genco. A Correlated Double Sampling Technique for Charge-Sensitive Amplifiers based on TFTs. In IEEE International Symposium on Circuits and Systems, ISCAS 2022, Austin, TX, USA, May 27 - June 1, 2022. pages 86-90, IEEE, 2022. [doi]

Abstract

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