Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò. Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 466-475, IEEE Computer Society, 1992.
Abstract is missing.