Michele Favalli, Marcello Dalpasso, Piero Olivo, Bruno Riccò. Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 865-874, IEEE Computer Society, 1993.
Abstract is missing.