Ahmed Fawaz, Ameen Jaber, Ali Kassem, Ali Chehab, Ayman I. Kayssi. Assessing testing techniques for resistive-open defects in nanometer CMOS adders. In 18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011. pages 165-168, IEEE, 2011. [doi]
@inproceedings{FawazJKCK11,
title = {Assessing testing techniques for resistive-open defects in nanometer CMOS adders},
author = {Ahmed Fawaz and Ameen Jaber and Ali Kassem and Ali Chehab and Ayman I. Kayssi},
year = {2011},
doi = {10.1109/ICECS.2011.6122240},
url = {http://dx.doi.org/10.1109/ICECS.2011.6122240},
researchr = {https://researchr.org/publication/FawazJKCK11},
cites = {0},
citedby = {0},
pages = {165-168},
booktitle = {18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1845-8},
}