Ahmed Fawaz, Ameen Jaber, Ali Kassem, Ali Chehab, Ayman I. Kayssi. Assessing testing techniques for resistive-open defects in nanometer CMOS adders. In 18th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2011, Beirut, Lebanon, December 11-14, 2011. pages 165-168, IEEE, 2011. [doi]
Abstract is missing.