Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs) - researchr publication authors

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Mahdi Fazeli, Seyed Nematollah Ahmadian, Seyed Ghassem Miremadi, Hossein Asadi, Mehdi Baradaran Tahoori. Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs). In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 70-75, IEEE, 2011. [doi]

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