Mahdi Fazeli, Seyed Nematollah Ahmadian, Seyed Ghassem Miremadi, Hossein Asadi, Mehdi Baradaran Tahoori. Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs). In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 70-75, IEEE, 2011. [doi]
@inproceedings{FazeliAMAT11,
title = {Soft error rate estimation of digital circuits in the presence of Multiple Event Transients (METs)},
author = {Mahdi Fazeli and Seyed Nematollah Ahmadian and Seyed Ghassem Miremadi and Hossein Asadi and Mehdi Baradaran Tahoori},
year = {2011},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763020},
researchr = {https://researchr.org/publication/FazeliAMAT11},
cites = {0},
citedby = {0},
pages = {70-75},
booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
publisher = {IEEE},
isbn = {978-1-61284-208-0},
}