Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs - researchr publication related

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Maximilian W. Feil, Hans Reisinger, André Kabakow, Thomas Aichinger, Wolfgang Gustin, Tibor Grasser. Optical Emission Correlated to Bias Temperature Instability in SiC MOSFETs. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 3, IEEE, 2022. [doi]

The following publications are possibly variants of this publication:

Threshold voltage peculiarities and bias temperature instabilities of SiC MOSFETsThomas Aichinger, Gerald Rescher, Gregor Pobegen. mr, 80:68-78, 2018. [doi]

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