Daniele Felici, Sandro Bonacini, Marco Ottavi. Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 187-190, IEEE, 2015. [doi]
Abstract is missing.