Derek Feltham, Phil Nigh, L. Richard Carley, Wojciech Maly. Current sensing for built-in testing of CMOS circuits. In Computer Design: VLSI in Computers and Processors, ICCD 1988., Proceedings of the 1988 IEEE International Conference on, Rye Brook, NY, USA, October 3-5, 1988. pages 454-457, IEEE, 1988. [doi]
@inproceedings{FelthamNCM88, title = {Current sensing for built-in testing of CMOS circuits}, author = {Derek Feltham and Phil Nigh and L. Richard Carley and Wojciech Maly}, year = {1988}, doi = {10.1109/ICCD.1988.25742}, url = {https://doi.org/10.1109/ICCD.1988.25742}, researchr = {https://researchr.org/publication/FelthamNCM88}, cites = {0}, citedby = {0}, pages = {454-457}, booktitle = {Computer Design: VLSI in Computers and Processors, ICCD 1988., Proceedings of the 1988 IEEE International Conference on, Rye Brook, NY, USA, October 3-5, 1988}, publisher = {IEEE}, isbn = {0-8186-0872-2}, }