A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD - researchr publication

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Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi. A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD. In 8th Asian Test Symposium (ATS 99), 16-18 November 1999, Shanghai, China. pages 95-100, IEEE Computer Society, 1999. [doi]

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